[IEEE IECON 2010 - 36th Annual Conference of IEEE...

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[IEEE IECON 2010 - 36th Annual Conference of IEEE Industrial Electronics - Glendale, AZ, USA (2010.11.7-2010.11.10)] IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society - Fine self-tuning method of both current sensor offset and electrical parameter variations for SPM motor

Uenaka, Yutaro, Sazawa, Masaki, Ohishi, Kiyoshi
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Year:
2010
Language:
english
DOI:
10.1109/iecon.2010.5675177
File:
PDF, 685 KB
english, 2010
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