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The combined effects of thermal aging and short-circuit stresses on transformer life
McNutt, W.J., Patel, M.R.Volume:
95
Language:
english
Journal:
IEEE Transactions on Power Apparatus and Systems
DOI:
10.1109/t-pas.1976.32221
Date:
July, 1976
File:
PDF, 2.00 MB
english, 1976