Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
R.I. Barabash, Y.F. Gao, G.E. Ice, O.M. Barabash, Jin-Seok Chung, W. Liu, R. Kröger, H. Lohmeyer, K. Sebald, J. Gutowski, T. Böttcher, D. HommelVolume:
528
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.msea.2010.04.045
File:
PDF, 1.18 MB
english, 2010