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[IEEE 2012 15th International Workshop on Computational Electronics (IWCE) - Madison, WI, USA (2012.05.22-2012.05.25)] 2012 15th International Workshop on Computational Electronics - Reduction of surface roughness induced spin relaxation in SOI MOSFETs
Osintsev, D., Baumgartner, O., Stanojevic, Z., Sverdlov, V., Selberherr, S.Year:
2012
Language:
english
DOI:
10.1109/iwce.2012.6242850
File:
PDF, 146 KB
english, 2012