Investigation of the fatigue behavior of Al thin films with...

Investigation of the fatigue behavior of Al thin films with different microstructure

Walther Heinz, Reinhard Pippan, Gerhard Dehm
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Volume:
527
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.msea.2010.08.046
File:
PDF, 1.35 MB
english, 2010
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