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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Testing of Asynchronous NULL Conventional Logic (NCL) Circuits in Synchronous-Based Desig
Al-Assadi, Waleed K., Kakarla, SindhuYear:
2007
Language:
english
DOI:
10.1109/dft.2007.40
File:
PDF, 343 KB
english, 2007