[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana...

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[IEEE Comput. Soc 17th IEEE VLSI Test...

[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores

Adham, S., Burek, D., Clark, C.J., Collins, M., Giles, G., Sales, A., Marinissen, E.J., McLaurin, T., Monzel, J., Muradali, F., Rajoki, J., Rajsuman, R., Ricchatti, M., Stannard, D., Udell, J., Varma,

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Year:

1999

Language:

english

DOI:

10.1109/vtest.1999.766707

File:

PDF, 496 KB

english, 1999

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