![](/img/cover-not-exists.png)
[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores
Adham, S., Burek, D., Clark, C.J., Collins, M., Giles, G., Sales, A., Marinissen, E.J., McLaurin, T., Monzel, J., Muradali, F., Rajoki, J., Rajsuman, R., Ricchatti, M., Stannard, D., Udell, J., Varma,Year:
1999
Language:
english
DOI:
10.1109/vtest.1999.766707
File:
PDF, 496 KB
english, 1999