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Scanned probe microscopy of YBa/sub 2/Cu/sub 3/O/sub x/ thin-film device structures on Si substrates
Moreland, J., Harvey, T.E., Ono, R.H., Roshko, A.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233360
Date:
March, 1993
File:
PDF, 1.09 MB
english, 1993