[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Fin flash memory cells with separated double gates
Jang-Gn Yun,, Yoon Kim,, Il Han Park,, Seongjae Cho,, Jung Hoon Lee,, Doo-Hyun Kim,, Gil Sung Lee,, Dong Hua Lee,, Se Hwan Park,, Wonbo Shim Jong-Duk Lee,, Byung-Gook Park,Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422287
File:
PDF, 173 KB
english, 2007