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[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Generalized analysis of reflection parameters meters
Palchun, Yu. A., Evgrafov, V. I., Kaverin, A. M., Vladimirova, S. V.Year:
2012
Language:
russian
DOI:
10.1109/apeie.2012.6628949
File:
PDF, 387 KB
russian, 2012