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[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Process-improved RRAM cell performance and reliability and paving the way for manufacturability and scalability for high density memory application
Kar, G.S., Fantini, A., Chen, Y-Y., Paraschiv, V., Govoreanu, B., Hody, H., Jossart, N., Tielens, H., Brus, S., Richard, O., Vandeweyer, T., Wouters, D.J., Altimime, L., Jurczak, M.Year:
2012
Language:
english
DOI:
10.1109/vlsit.2012.6242509
File:
PDF, 652 KB
english, 2012