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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A random access scan architecture to reduce hardware overhead
Mudlapur, A.S., Agrawal, V.D., Singh, A.D.Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1583993
File:
PDF, 275 KB
english, 2005