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[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - Design techniques to combat process, temperature and supply variations in Bluetooth RFIC
Tee, Y.T., Seng, Y.H., Boon, L.P., Hung, T.K., Tachi, S., Ling, K.S., Murakami, T., Hui, S.J., Tiong, L.C., Choon, T.L., Kheng, W.W., Jun, X.Q., Meng, L.C., Hwi, L.S., Wei, X., Itoh, M.Year:
2003
Language:
english
DOI:
10.1109/rfic.2003.1214006
File:
PDF, 192 KB
english, 2003