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Structural characterisation of nickel silicide performed by two-dimensional X-ray microdiffraction
P. Colombi, E. Bontempi, U.M. Meotto, S. Porro, C. Ricciardi, L. Scaltrito, S. Ferrero, G. Richieri, L. Merlin, L.E. DeperoVolume:
114-115
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mseb.2004.07.071
File:
PDF, 341 KB
english, 2004