[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - On comparison of NCR effectiveness with a reduced I/sub DDQ/ vector set
Sabade, S., Walker, D.M.H.Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299227
File:
PDF, 1.42 MB
english, 2004