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[IEEE 2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID) - Porto, Portugal (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Testing and Validation Lifecycle - Improving TTCN-3 Test System Robustness Using Software Fault Tolerance

Perala, Juho
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Year:
2009
Language:
english
DOI:
10.1109/valid.2009.27
File:
PDF, 421 KB
english, 2009
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