[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002)...

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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Testing static and dynamic faults in random access memories

Hamdioui, S., Al-Ars, Z., van de Goor, Ad.J.
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Year:
2002
Language:
english
DOI:
10.1109/vts.2002.1011170
File:
PDF, 327 KB
english, 2002
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