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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Device reliability in analog CMOS applications
Thewes, R., Brederlow, R., Schlunder, C., Wieczorek, P., Hesener, A., Ankele, B., Klein, P., Kessel, S., Weber, W.Year:
1999
Language:
english
DOI:
10.1109/iedm.1999.823851
File:
PDF, 423 KB
english, 1999