[IEEE 2004 IEEE International Workshop on Current and Defect Based Testing - Napa Valley, CA, USA (25 April 2004)] Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) - On the effectiveness of detecting small delay defects in the slack interval
Haihua Yan,, Singh, A.D.Year:
2004
Language:
english
DOI:
10.1109/dbt.2004.1408955
File:
PDF, 320 KB
english, 2004