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Structural, chemical and optical characterizations of nanocrystallized AlN:Er thin films prepared by r.f. magnetron sputtering
V. Brien, P. Miska, H. Rinnert, D. Genève, P. PigeatVolume:
146
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.mseb.2007.07.018
File:
PDF, 352 KB
english, 2008