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[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Physical Understanding of SANOS Disturbs and VARIOT Engineered Barrier as a Solution
Furnemont, A., Rosmeulen, M., Cacciato, A., Breuil, L., de Meyer, K., Maes, H., van Houdt, J.Year:
2007
Language:
english
DOI:
10.1109/nvsmw.2007.4290596
File:
PDF, 515 KB
english, 2007