Temperature dependence of hot-carrier-induced degradation...

IEEE Electron Device Letters 2002 / 07 Vol. 23; Iss. 7

Temperature dependence of hot-carrier-induced degradation in 0.1 μm SOI nMOSFETs with thin oxide

Wen-Kuan Yeh,, Wen-Han Wang,, Yean-Kuen Fang,, Fu-Liang Yang,
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Volume:
23
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2002.1015228
Date:
July, 2002
File:
PDF, 190 KB
english, 2002
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