[IEEE 2014 83rd ARFTG Microwave Measurement Conference (ARFTG) - Tampa, FL, USA (2014.6.6-2014.6.6)] 83rd ARFTG Microwave Measurement Conference - Sensitivity of AM/AM linearizer to AM/PM distortion in devices
Ogboi, F.L., Tasker, P., Mohkti, Z., Lees, J., Benedikt, J., Bensmida, S., Morris, K., Beach, M., McGeehan, J.Year:
2014
Language:
english
DOI:
10.1109/arftg.2014.6899507
File:
PDF, 1023 KB
english, 2014