[IEEE 2012 13th International Symposium on Quality...

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[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Dynamically biased low power high performance 3.3V output buffer in a single well bulk CMOS 1.8V oxide 45nm process

Rajagopal, Karthik
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Year:
2012
Language:
english
DOI:
10.1109/isqed.2012.6187489
File:
PDF, 421 KB
english, 2012
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