[IEEE IEEE APCCAS 2000. 2000 IEEE Asia-Pacific Conference on Circuits and Systems. Electronic Communication Systems. Proceedings - Tianjin, China (4-6 Dec. 2000)] IEEE APCCAS 2000. 2000 IEEE Asia-Pacific Conference on Circuits and Systems. Electronic Communication Systems. (Cat. No.00EX394) - Effect of high gate current density and temperature stress on performance of GaAs MESFETs with TiAl and TiPtAu gate
Wanrong Zhang,, Zhiguo Li,, Yuzhen Gao,, Yaohai Cheng,, Yinghua Sun,, Jianxin Chen,, Guangdi Shen,Year:
2000
Language:
english
DOI:
10.1109/apccas.2000.913621
File:
PDF, 292 KB
english, 2000