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Application information mapping test: An efficient content-level semantic equivalence test procedure for B2B integration
Shin, Junho, Kim, Jaewook, Ivezic, NenadVolume:
22
Language:
english
Journal:
International Journal of Computer Integrated Manufacturing
DOI:
10.1080/09511920903030361
Date:
October, 2009
File:
PDF, 1.03 MB
english, 2009