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[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - Analogue characterization of horizontal bars capacitors for smart power applications
Zhenqiu Ning,, Delecourt, H.-X., De Schepper, L., Tack, D., Desoete, B., Gillon, R.Year:
2006
Language:
english
DOI:
10.1109/icmts.2006.1614306
File:
PDF, 317 KB
english, 2006