[IEEE 2011 IEEE 35th IEEE Annual Computer Software and Applications Conference Workshops (COMPSACW) - Munich, Germany (2011.07.18-2011.07.22)] 2011 IEEE 35th Annual Computer Software and Applications Conference Workshops - Statistical Evaluation of Test Sets Using Mutation Analysis
Belli, Fevzi, Beyazit, Mutlu, Hollmann, Axel, Guler, NevinYear:
2011
Language:
english
DOI:
10.1109/compsacw.2011.39
File:
PDF, 351 KB
english, 2011