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[IEEE 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Monterey, CA, USA (25-27 April 2006)] 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Analysis of the Complex Dielectric Permittivity Behavior of Composites based on Al>inf/infinf/inf
Battat, J., Calame, J.P.Year:
2006
Language:
english
DOI:
10.1109/ivelec.2006.1666173
File:
PDF, 1.85 MB
english, 2006