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The peculiarities of Si/SiO2 interfaces in the Si–SiO2 systems with Si nanocrystals
T. Kryshtab, G. Gómez Gasga, N. Korsunska, M. Baran, S. Kirillova, L. Khomenkova, A. Sachenko, T. Stara, Y. Venger, Y. Emirov, Y. Goldstein, E. Savir, J. JedrzejewskiVolume:
174
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.mseb.2010.04.027
File:
PDF, 281 KB
english, 2010