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[IEEE IECON 2010 - 36th Annual Conference of IEEE Industrial Electronics - Glendale, AZ, USA (2010.11.7-2010.11.10)] IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society - Use of high order harmonics for diagnosis of simultaneous faults via Wigner-Ville distributions
Climente-Alarcon, V., Antonino-Daviu, J. A., Riera-Guasp, M., Roger-Folch, J., Jover-Rodriguez, P., Arkkio, A.Year:
2010
Language:
english
DOI:
10.1109/iecon.2010.5675509
File:
PDF, 756 KB
english, 2010