Depth profiles of nickel ion damage in helium-implanted...

Depth profiles of nickel ion damage in helium-implanted nickel

Farrell, K., Packan, N. H., Houston, J. T.
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Volume:
62
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578208235408
Date:
January, 1982
File:
PDF, 2.21 MB
english, 1982
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