[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Pocono Manor, PA, USA (17-20 Oct. 1993)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - An experimental investigation on the degradation characteristics of 22.9kV XLPE cables; dependence on the compounds and curing process
Koo, J., Kim, H., Kim, K., Ann, Y.Year:
1993
Language:
english
DOI:
10.1109/CEIDP.1993.378876
File:
PDF, 298 KB
english, 1993