[IEEE 2011 21st International Conference on Noise and...

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[IEEE 2011 21st International Conference on Noise and Fluctuations (ICNF) - Toronto, ON, Canada (2011.06.12-2011.06.16)] 2011 21st International Conference on Noise and Fluctuations - Evidence of charge carrier number fluctuations in InN thin films?

Mutta, Geeta Rani, Guillet, Bruno, Mechin, Laurence, Vilalta-Clemente, Arantxa, Grandal, Javier, Sanchez-Garcia, Miguel A., Martin, Sara, Calle, Fernando, Ruterana, Pierre, Routoure, Jean-Marc
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Year:
2011
Language:
english
DOI:
10.1109/ICNF.2011.5994375
File:
PDF, 346 KB
english, 2011
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