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Low cost technique for measuring in situ strain of nanostructures
A. Rizzo, L. Capodieci, D. Rizzo, U. GaliettiVolume:
25
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.msec.2005.06.029
File:
PDF, 292 KB
english, 2005