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[IEEE IEEE EDUCON 2010 Conference - Madrid, Spain (2010.04.14-2010.04.16)] IEEE EDUCON 2010 Conference - Personalized construction of self-evaluation tests
Paris-Requeiro, Maria T., Cabrero-Canosa, Mariano J.Year:
2010
Language:
english
DOI:
10.1109/educon.2010.5492486
File:
PDF, 470 KB
english, 2010