![](/img/cover-not-exists.png)
[IEEE 2010 5th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2010.10.20-2010.10.22)] 2010 5th International Microsystems Packaging Assembly and Circuits Technology Conference - Development of a 20 μm pitch high frequency contact probe
Aoyagi, Masahiro, Kikuchi, Katsuya, Nakagawa, Hiroshi, Matsumur, Kiyoshi, Kiyota, ShigeoYear:
2010
Language:
english
DOI:
10.1109/impact.2010.5699493
File:
PDF, 290 KB
english, 2010