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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Space Domain Reflectometry for open failure localization
Gaudestad, Jan, Talanov, Vladimir, Gagliolo, Nicolas, Orozco, AntonioYear:
2012
Language:
english
DOI:
10.1109/ipfa.2012.6306311
File:
PDF, 804 KB
english, 2012