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[IEEE 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2008.03.16-2008.03.20)] 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - Determining Thermal Simulation Data from Transient Measurements
Janicki, Marcin, Kindermann, Stefan, Pietrzak, Piotr, Vermeersch, Bjorn, Banaszczyk, Jedrzej, de Mey, Gilbert, Napieralski, AndrzejYear:
2008
Language:
english
DOI:
10.1109/stherm.2008.4509390
File:
PDF, 618 KB
english, 2008