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[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Testing and diagnosing embedded content addressable memories
Jin-Fu Li,, Ruey-Shing Tzeng,, Cheng-Wen Wu,Year:
2002
Language:
english
DOI:
10.1109/vts.2002.1011169
File:
PDF, 281 KB
english, 2002