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Performance Evaluation and Reliability Issues of Junctionless CSG MOSFET for RFIC Design
Pratap, Yogesh, Haldar, Subhasis, Gupta, R. S., Gupta, MridulaVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2296524
Date:
March, 2014
File:
PDF, 1.51 MB
english, 2014