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[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT)
Kumar, Pankaj, Kondekar, P.N., Singh, Sangeeta, Agrawal, IshuYear:
2013
Language:
english
DOI:
10.1109/ICECS.2013.6815344
File:
PDF, 696 KB
english, 2013