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Multilevel RTS in Proton Irradiated CMOS Image Sensors Manufactured in a Deep Submicron Technology
Goiffon, V., Hopkinson, G. R., Magnan, P., Bernard, F., Rolland, G., Saint-Pe, O.Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2014759
Date:
August, 2009
File:
PDF, 856 KB
english, 2009