[IEEE 2012 17th IEEE European Test Symposium (ETS) -...

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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Combining dynamic slicing and mutation operators for ESL correction

Repinski, Urmas, Hantson, Hanno, Jenihhin, Maksim, Raik, Jaan, Ubar, Raimund, Di Guglielmo, Giuseppe, Pravadelli, Graziano, Fummi, Franco
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Year:
2012
Language:
english
DOI:
10.1109/ets.2012.6233020
File:
PDF, 335 KB
english, 2012
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