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[IEEE 2009 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Boston, MA, USA (2009.06.7-2009.06.9)] 2009 IEEE Radio Frequency Integrated Circuits Symposium - 40 ns pulsed I/V set-up and measurement method applied to InP HBT characterization and electro-thermal modeling
Saleh, A., Chahine, M. Abou, Reveyrand, T., Neveux, G., Barataud, D., Nebus, J. Michel, Quere, R., Bouvier, Y., Godin, J., Riet, M.Year:
2009
Language:
english
DOI:
10.1109/rfic.2009.5135567
File:
PDF, 307 KB
english, 2009