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[IEEE 2013 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Daerah Langkawi, Malaysia (2013.09.25-2013.09.27)] RSM 2013 IEEE Regional Symposium on Micro and Nanoelectronics - Effect of source-drain metal shield in FET structure on drain leakage current
Yusof, Khairul Aimi, Noh, Nurul Izzati Mohammad, Herman, Sukreen Hana, Abdullah, Ali Zaini, Hussin, Mohd Rofei Mat, Abdullah, Wan Fazlida HanimYear:
2013
Language:
english
DOI:
10.1109/RSM.2013.6706482
File:
PDF, 284 KB
english, 2013