[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - Efficient test scheduling for hierarchical core based design
Tai-Ping Wang,, Cheng-Yu Tsai,, Ming-Der Shieh,, Kuen-Jone Lee,Year:
2005
Language:
english
DOI:
10.1109/vdat.2005.1500055
File:
PDF, 796 KB
english, 2005