[IEEE 2008 2nd International Conference on Signals, Circuits and Systems (SCS) - Nabeul, Tunisia (2008.11.7-2008.11.9)] 2008 2nd International Conference on Signals, Circuits and Systems - Extraction and simulation of potential bridging faults and open defects affecting standard cell libraries
Ladhar, Aymen, Mohamed Masmoudi,, Laroussi Bouzaida,Year:
2008
Language:
english
DOI:
10.1109/ICSCS.2008.4746914
File:
PDF, 551 KB
english, 2008