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[IEEE 2011 11th International Conference on Electrical Power Quality and Utilisation - (EPQU) - Lisbon, Portugal (2011.10.17-2011.10.19)] 11th International Conference on Electrical Power Quality and Utilisation - Voltage dip immunity aspects of power-electronics equipment — Recommendations from CIGRE/CIRED/UIE JWG C4.110
Bollen, Math H. J., Cundeva, Snezana, Gordon, Jose-Maria Romero, Djokic, Sasa Z., Stockman, Kurt, Milanovic, Jovica V., Neumann, Robert, Ethier, GaetanYear:
2011
Language:
english
DOI:
10.1109/epqu.2011.6128895
File:
PDF, 401 KB
english, 2011