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[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - The Effects of Over and Under Sampling on Fault-prone Module Detection
Kamei, Yasutaka, Monden, Akito, Matsumoto, Shinsuke, Kakimoto, Takeshi, Matsumoto, Ken-ichiYear:
2007
Language:
english
DOI:
10.1109/esem.2007.28
File:
PDF, 395 KB
english, 2007