[IEEE First International Symposium on Empirical Software...

  • Main
  • [IEEE First International Symposium on...

[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - The Effects of Over and Under Sampling on Fault-prone Module Detection

Kamei, Yasutaka, Monden, Akito, Matsumoto, Shinsuke, Kakimoto, Takeshi, Matsumoto, Ken-ichi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2007
Language:
english
DOI:
10.1109/esem.2007.28
File:
PDF, 395 KB
english, 2007
Conversion to is in progress
Conversion to is failed